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Your Position :Home->Past Journals Catalog->2014年51 No.3

Techniques for field survey and monitoring of wheat aphids in China
Author of the article:ZHOU Hai-Bo1, 2** Cheng Deng-Fa1 CHEN Ju-Lian1***
Author's Workplace:1. State Key Laboratory for Biology of Plant Diseases and Insect Pests, Institute of Plant Protection, Chinese Academy of Agricultural Sciences, Beijing 100193, China; 2. Ningxia Entry-Exit Inspection and Quarantine Bureau of People's Republic of China,Yinchuan 750001, China
Key Words:wheat, aphids, investigation, monitoring, IPM
Abstract:Aphids are globally important pests of wheat crops. More and more research has led to a clearer understanding of their biology, life habits and demographics. Wheat aphids have a short life cycle, high fecundity, display phototaxis, chemotaxis and have the capacity for long distance migration. Aphid infestations on wheat leaves and ears have a clustered distribution. Aphids are typical phloem-piercing, sap-sucking pests that damage wheat not only by their feeding behavior but also by acting as a vector of the barley yellow dwarf virus (BYDV) which adversely affects wheat yield and grain quality. Several abiotic and biotic factors, such host plant resistance, natural enemies, weather factors, and agri-ecosystem engineering,
have some impact on wheat aphids. Based on current understanding of wheat aphid biology, ecology and physiology, a set of techniques for the field survey, monitoring and control of aphid populations on wheat crops is described which provides a foundation for the monitoring and integrated management of wheat aphids in China.
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