[Objectives]  To determine the effect of wheat variety on the spatial distribution pattern of larvae of Sitodiplosis mosellana (Géhin) (Diptera: Cecidomyiidae) in wheat ears, so as to provide scientific guidance for field sampling. [Methods]  The number of S. mosellana larvae in wheat kernels of four resistant, and four susceptible, wheat varieties planted in experimental fields in Zhouzhi County, Shaanxi province, were investigated by dissecting wheat ears in May 2015. Six aggregation indices, and Iwao’s regression models, were applied to analyze the spatial distribution patterns of larvae. [Results]  S. mosellana larvae had a clumped distribution both within the entire ear of each of the eight wheat varieties, and in the top, middle and bottom, sections of wheat ears. The degree of clumping was greater in resistant, than in susceptible, wheat varieties. The basic unit of distribution was individual groups in both resistant and susceptible varieties suggesting that there was mutual attraction between individual larvae. The mean λ value indicated that clumping in varieties with higher resistance was mainly caused by environmental factors, including chemical substances and the physical structure of wheat ears, whereas that in susceptible varieties might be due to a combination of the oviposition habits of adults and environmental heterogeneity. The distribution of larvae in different parts of wheat ears was similar in all varieties. The highest number of larvae were found in the top of wheat ears, followed by the mid-section, with the least number of larvae in the bottom part. The theoretical sampling number within allowable error was determined according to Iwao’s regression formula. [Conclusion]  S. mosellana larvae had a clumped distribution in the ears of eight wheat cultivars with different levels of resistance. Feasible sampling numbers should be confirmed by field studies based on the average larval density in local cultivars.