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Your Position :Home->Past Journals Catalog->2001 Vol.3

Bean yield loss caused by Liriomyza sativae and controld threshold.
Author of the article:ZHAO Gang,LIU Pei-Ting,LU Dao-Xun
Author's Workplace:(Liuan Prefecture Station of Plant Protection, Province, Liuan237001, Anhui, China).
Key Words:Liriomyzae sativae; yield loss; action threshold
Abstract:The relationship between insect density and bean yield loss caused by Liriomyza sativa was analysed under the natural and artificial conditions.The results showed that the pest population density and bean yield loss were positively correlated and t
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