Latest Cover

Online Office

Contact Us

Issue:ISSN 2095-1353
           CN 11-6020/Q
Director:Chinese Academy of Sciences
Sponsored by:Chinese Society of Entomological;institute of zoology, chinese academy of sciences;
Address:Chaoyang District No. 1 Beichen West Road, No. 5 hospital,Beijing City,100101, China
Tel:+86-10-64807137
Fax:+86-10-64807137
Email:entom@ioz.ac.cn
Your Position :Home->Past Journals Catalog->2013年50 No.6

Using spectral reflectance in the field to determine the resistance of cotton varieties to Apolygus lucorum
Author of the article:ZHAO QiuJian1,2**CAO Yang1ZHOU YanLe1LI ChangYou2
Author's Workplace:1.State Key Laboratory for Biology of Plant Diseases and Insect Pests,Institute of Plant Protection,Chinese Academy of Agricultural Sciences,Beijing100193, China;2.College of Agronomy and Plant Protection, Qingdao Agricultural University,Qingdao266109, China
Key Words:cotton, Apolygus lucorum, reflectance, insect resistance
Abstract:

The levels of damage caused by the mirid bug Apolygus lucorum Meyer-Dür on fourteen cotton varieties during the growing season were investigated in the field. Of these varieties it was found that Yazhoumian displayed the highest resistance to A. lucorum, that twelve cotton varieties including Jifengza-7 displayed moderate resistance, and that Ling\|17 appeared the most susceptible. The reflectance from the canopies of the 14 varieties was measured by ASD Handheld Spectroradiometers and correlation analysis was undertaken to determine the wavebands that were sensitive to damage levels. The first derivative values of canopy reflectance were found to differ significantly among varieties from 690 to 750 nm (P <0.05). Also, the first derivative value of canopy reflectance at 717 nm showed a significant negative correlation with the index of resistance to A. lucorum for cotton plants at the seedling stage (P <0.05), which could reflect the levels of damage caused by A. lucorum. Therefore, spectral models based on reflectance from the canopy could be used to diagnose the resistance of cotton plants to A. lucorum.
 

CopyRight©2025 Chinese Journal of Aplied Entomology