Using spectral reflectance in the field to determine the resistance of cotton varieties to Apolygus lucorum
Author of the article:ZHAO QiuJian1,2**CAO Yang1ZHOU YanLe1LI ChangYou2
Author's Workplace:1.State Key Laboratory for Biology of Plant Diseases and Insect Pests,Institute of Plant Protection,Chinese Academy of Agricultural Sciences,Beijing100193, China;2.College of Agronomy and Plant Protection, Qingdao Agricultural University,Qingdao266109, China
Key Words:cotton, Apolygus lucorum, reflectance, insect resistance
Abstract:
The levels of damage caused by the mirid bug Apolygus lucorum Meyer-Dür on fourteen cotton varieties during the growing season were investigated in the field. Of these varieties it was found that Yazhoumian displayed the highest resistance to A. lucorum, that twelve cotton varieties including Jifengza-7 displayed moderate resistance, and that Ling\|17 appeared the most susceptible. The reflectance from the canopies of the 14 varieties was measured by ASD Handheld Spectroradiometers and correlation analysis was undertaken to determine the wavebands that were sensitive to damage levels. The first derivative values of canopy reflectance were found to differ significantly among varieties from 690 to 750 nm (P <0.05). Also, the first derivative value of canopy reflectance at 717 nm showed a significant negative correlation with the index of resistance to A. lucorum for cotton plants at the seedling stage (P <0.05), which could reflect the levels of damage caused by A. lucorum. Therefore, spectral models based on reflectance from the canopy could be used to diagnose the resistance of cotton plants to A. lucorum.