Study on the corn yield loss damaged by the second generation of Asian corn borer, Ostrinia furnacalis (Guenée)
Author of the article:ZHOU Shu-Xiang1** LU Xin1*** WANG Zheng-Ying2 LI Li-Juan1 ZHANG Guo-Hong1 DING Yan1
Author's Workplace：1. Institute of Plant Protection, Jilin Academy of Agricultural Sciences, Gongzhuling 136100, China;2. Institute of Plant Protection, Chinese Academy of Agricultural Sciences, Beijing 100193, China
Key Words：second generation, Ostrinia furnacalis, yield loss, corn, ecomomic threshold
Abstract： [Objectives] To study lost corn yield caused by the second generation of Ostrinia furnacalis (Guenée) damage. [Methods] The maize single cross XY335 was artificially infested with the 2nd generation Asian corn borer O. furnacalis and subsequent crop damage quantified. [Results] Grain yield per plant was significantly correlated with the number of egg-masses, stalk cavities and tunnel length. Maize yield loss increased by 4.52% with per percent increase in stalk cavities and 8.34% per 10 cm increase in tunnel length. The correlation between yield loss and the number of egg-masses per 100 plants was fitted with the equation: z =－10.0297 + 4.034 ln (x). [Conclusion] According to the economic threshold definition, the control index of the 2nd generation Asian corn borer is 12.8 egg-masses per 100 plants.